Characterisation of the Fatigued State of Ferroelectric Pzt Thin-Film Capacitors

AuthID
P-008-RTS
6
Author(s)
Colla, EL
·
Taylor, D
·
Tagantsev, AK
·
Brooks, KG
·
Setter, N
Document Type
Article
Year published
1995
Published
in MICROELECTRONIC ENGINEERING, ISSN: 0167-9317
Volume: 29, Issue: 1-4, Pages: 145-148 (4)
Conference
1St European Meeting on Integrated Ferroelectrics (Emif 1), at the 8Th European Meeting on Ferroelectrics (Emf 8), Date: JUL 03-05, 1995, Location: NIJMEGEN, NETHERLANDS, Sponsors: European Commiss, GEC Marconi, Philips Res, Siemens, Thomson CSF, Univ Nijmegen Univ, Fac Sci, Host: UNIV NIJMEGEN, FAC SCI
Indexing
Publication Identifiers
Scopus: 2-s2.0-0029492235
Wos: WOS:A1995TP60800029
Source Identifiers
ISSN: 0167-9317
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