Adc Testing Based on Ieee 1057-94 Standard - Some Critical Notes

AuthID
P-008-S8T
4
Author(s)
Daponte, P
·
Monteiro, CL
Document Type
Proceedings Paper
Year published
2000
Published
in Conference Record - IEEE Instrumentation and Measurement Technology Conference
Volume: 1, Pages: 119-124
Conference
Imtc/2000 - 17Th Ieee Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control', Date: 1 May 2000 through 4 May 2000, Location: Baltimore, MD, USA, Sponsors: IEEE Instrumentation and Measurement Society
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Publication Identifiers
SCOPUS: 2-s2.0-0033705244
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