Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Intermodulation Distortion Behavior in Ldmos Transistor Amplifiers
AuthID
P-008-YBX
4
Author(s)
Fager, C
·
de Carvalho, NB
·
Pedro, JC
·
Zirath, H
1
Editor(s)
Hamilton, R
Document Type
Proceedings Paper
Year published
2002
Published
in
2002 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3
in
IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST,
ISSN: 0149-645X
Volume: 1, Pages: 131-134 (4)
Conference
Ieee Mtt-S International Microwave Symposium,
Date:
JUN 02-07, 2002,
Location:
SEATTLE, WA,
Sponsors:
IEEE, MTTS
Indexing
Wos
®
Scopus
®
Crossref
®
5
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1109/mwsym.2002.1011576
Scopus
: 2-s2.0-0036073129
Wos
: WOS:000178310900029
Source Identifiers
ISSN
: 0149-645X
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service