High-Selectivity Single-Chip Spectrometer for Operation at Visible Wavelengths

AuthID
P-008-YJ9
1
Editor(s)
Anon
Document Type
Proceedings Paper
Year published
1998
Published
in INTERNATIONAL ELECTRON DEVICES MEETING 1998 - TECHNICAL DIGEST, ISSN: 0163-1918
Pages: 467-470 (4)
Conference
International Electron Devices Meeting (Iedm), Date: DEC 06-09, 1998, Location: SAN FRANCISCO, CA, Sponsors: Electron Devices Soc IEEE
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0032255796
Wos: WOS:000078581800108
Source Identifiers
ISSN: 0163-1918
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.