Publications

Generating Reduced Order Models via Peec for Capturing Skin and Proximity Effects

AuthID
P-009-0J7

Author(s)

Kamon, M

Marques, N

Silveira, LM

White, J

Editor(s)

Anon

Document Type

Proceedings Paper

Year published

1997

Published

in ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING

Pages: 259-262 (4)

Conference

6Th Topical Meeting on Electrical Performance of Electronic Packaging, Date: OCT 27-29, 1997, Location: SAN JOSE, CA, Sponsors: IEEE Microwave Theory & Tech Soc, IEEE Components Packaging & Mfg Technol Soc

Indexing

Wos^®

Scopus^®

Crossref^®

Google Scholar^®

Metadata
Sources

Publication Identifiers

DOI: 10.1109/epep.1997.634084

SCOPUS: 2-s2.0-0031335538

Wos: WOS:A1997BJ93U00058

Export Publication Metadata

Marked List

Add to Marked List

Info

At this moment we don't have any links to full text documens.

Generating Reduced Order Models via Peec for Capturing Skin and Proximity Effects

Useful Links

Get Help

Federated Authentication (Click on the image)

Generating Reduced Order Models via Peec for Capturing Skin and Proximity Effects

Useful Links

Get Help