Noise and Jitter in Cmos Digitally Controlled Delay Lines

AuthID
 P-009-2MX
2
Author(s)
Document Type
Proceedings Paper
Year published
2006
Published
in 2006 13TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS, VOLS 1-3
Pages: 1356-1359 (4)
Conference
13Th Ieee International Conference on Electronics, Circuits and Systems, Date: DEC 10-13, 2006, Location: Nice, FRANCE, Sponsors: IEEE, IEEE Sect France, ATMEL, Mentor Graph, Texas Instruments, Cadence
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Publication Identifiers
SCOPUS: 2-s2.0-47349111847
Wos: WOS:000252489600339
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