Set-Up for Dynamic Testing of Adcs Using the Histogram Method

AuthID
 P-000-X71
2
Author(s)
Bras, V
·
Document Type
Proceedings Paper
Year published
2001
Published
in ICEMI'2001: FIFTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT AND INSTRUMENTS, VOL 1, CONFERENCE PROCEEDINGS
Pages: 16-20 (5)
Conference
5Th International Conference on Electronic Measurement and Instruments, Date: NOV 18-21, 2001, Location: GUILIN, PEOPLES R CHINA, Sponsors: Chinese Inst Electr, Chinese Instrumentat Soc, IEEE Beijing Sect, Electr Measurement & Instrument Soc, Host: GUILIN UNIV ELECTR TECHNOL
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Wos: WOS:000176775300004
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