Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Seeding Effect on the Fatigue Behaviour of Pzt Thin Films
AuthID
P-000-X8Y
5
Author(s)
Wu, AY
·
Vilarinho, PM
·
Kholkin, AL
·
Salvado, IMM
·
Baptista, JL
Document Type
Article
Year published
2001
Published
in
INTEGRATED FERROELECTRICS,
ISSN: 1058-4587
Volume: 37, Issue: 1-4, Pages: 475-484 (10)
Conference
13Th International Symposium on Integrated Ferroelectrics,
Date:
MAR 11-14, 2001,
Location:
COLORADO SPRINGS, COLORADO,
Sponsors:
aixACCT, Aixtron, Panasonic, Ramtron, Symetrix, Int Journal Integraded Ferroelect
Indexing
Wos
®
Scopus
®
Crossref
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1080/10584580108015674
SCOPUS
: 2-s2.0-3142690219
Wos
: WOS:000173066400017
Source Identifiers
ISSN
: 1058-4587
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service