Probing the Elastic Properties of Individual Nanostructures by Combining in Situ Atomic Force Microscopy and Micro-X-Ray Diffraction

AuthID
 P-009-EGK
9
Author(s)
Scheler, T
·
Cornelius, TW
·
Mocuta, C
·
Malachias, A
·
Magalhaes Paniago, R
·
Comin, F
·
Chevrier, J
·
Metzger, TH
Document Type
Article
Year published
2009
Published
in APPLIED PHYSICS LETTERS, ISSN: 0003-6951
Volume: 94, Issue: 2, Pages: 023109 (3)
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Publication Identifiers
SCOPUS: 2-s2.0-58349114312
Wos: WOS:000262534900071
Source Identifiers
ISSN: 0003-6951
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