Defect-Related Photoluminescence from Sio 2 Thin Films by Si-Ge Ions Doped

AuthID
 P-009-FSK
4
Author(s)
Zhong, K
·
Xia, YD
·
Fu, J
Document Type
Proceedings Paper
Year published
2011
Published
in Advanced Materials Research, ISSN: 1022-6680
Volume: 328-330, Pages: 1153-1156
Conference
2011 International Conference on Mechatronics and Materials Processing, Icmmp 2011, Date: 18 November 2011 through 20 November 2011, Location: Guangzhou, Sponsors: Guangzhou University
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Publication Identifiers
SCOPUS: 2-s2.0-80053114781
Source Identifiers
ISSN: 1022-6680
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