Trap States as an Explanation for the Meyer-Neldel Rule in Semiconductors

AuthID
 P-000-36P
2
Author(s)
Document Type
Article
Year published
2005
Published
in ORGANIC ELECTRONICS, ISSN: 1566-1199
Volume: 6, Issue: 3, Pages: 137-141 (5)
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Publication Identifiers
SCOPUS: 2-s2.0-20444365830
Wos: WOS:000230436000005
Source Identifiers
ISSN: 1566-1199
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