Measuring the Magnitude of Envelope Fluctuations: Should We Use the Papr?

AuthID
 P-00A-9M8
5
Author(s)
Bento, P
·
Document Type
Proceedings Paper
Year published
2014
Published
in 2014 IEEE 80TH VEHICULAR TECHNOLOGY CONFERENCE (VTC FALL), ISSN: 1550-2252
Conference
80Th Ieee Vehicular Technology Conference (Vtc Fall), Date: SEP 14-17, 2014, Location: Vancouver, CANADA, Sponsors: IEEE, TELUS, Huawei Technologies Co Ltd, Natl Instruments, IMST GmbH, FEKO, EM Software & Syst
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Publication Identifiers
SCOPUS: 2-s2.0-84919459119
Wos: WOS:000353345400253
Source Identifiers
ISSN: 1550-2252
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