Influence of Frequency Errors in the Variance of the Cumulative Histogram

AuthID
P-001-2BT
2
Author(s)
2
Editor(s)
Hunter, J; Johnson, L
Document Type
Proceedings Paper
Year published
2000
Published
in 2000 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST, ISSN: 0589-1485
Pages: 585-586 (2)
Conference
Conference on Precision Electromagnetic Measurements (Cpem 2000), Date: MAY 14-19, 2000, Location: SYDNEY, AUSTRALIA, Sponsors: Int Bur Weights & Measures, IEEE Instrumentat & Measurement Soc, Natl Inst Stand & Technol, Natl Res Council Canada, Union Radio Sci Int, CSIRO, Natl Measurement Lab, Natl Facil, Ind Sci Resources, Ind Res Ltd, Nat Assoc Testing Authorities, Stand Australia, Natl Stand Commiss, Joint Accreditat Syst Australia & New Zealand, Korea Res Inst Stand & Sci, Ctr Measurement Stand, ITRI, Fluke Corp, Int Union Pure & Appl Phys, Natl Conf Stand Labs, Oxford Instruments, Prema Prazisionselektron, Metrol Soc Australia, Texas Instruments, TransGrid
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Publication Identifiers
SCOPUS: 2-s2.0-0033680453
Wos: WOS:000089712400295
Source Identifiers
ISSN: 0589-1485
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