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Strain Distribution in Gan Hexagons Measured by Raman Spectroscopy
AuthID
P-001-31B
4
Author(s)
Seitz, R
·
Monteiro, T
·
Pereira, E
·
di Forte Poisson, M
Document Type
Article
Year published
1999
Published
in
PHYSICA STATUS SOLIDI B-BASIC RESEARCH,
ISSN: 0370-1972
Volume: 216, Issue: 1, Pages: 775-778 (4)
Conference
3Rd International Conference on Nitride Semiconductors (Icns 99),
Date:
JUL 04-09, 1999,
Location:
MONTPELLIER, FRANCE
Indexing
Wos
®
Scopus
®
Crossref
®
1
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®
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Publication Identifiers
DOI
:
10.1002/(sici)1521-3951(199911)216:1<775::aid-pssb775>3.0.co;2-x
SCOPUS
: 2-s2.0-0033243032
Wos
: WOS:000084193900147
Source Identifiers
ISSN
: 0370-1972
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