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Field Emission Interferometry with the Scanning Tunneling Microscope
AuthID
P-001-4BC
8
Author(s)
Caamano, AJ
·
Pogorelov, Y
·
Custance, O
·
Mendez, J
·
Baro, AM
·
Veuillen, JY
·
Gomez Rodriguez, JM
·
Saenz, JJ
Document Type
Letter
Year published
1999
Published
in
SURFACE SCIENCE,
ISSN: 0039-6028
Volume: 426, Issue: 1, Pages: L420-L425 (6)
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Wos
®
Scopus
®
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®
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Publication Identifiers
DOI
:
10.1016/s0039-6028(99)00346-5
SCOPUS
: 2-s2.0-0032638703
Wos
: WOS:000080249600003
Source Identifiers
ISSN
: 0039-6028
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