Publications

Simulation of the Interband S-D and Intraband S-S Electron-Phonon Contributions to the Temperature Dependence of the Electrical Resistivity in Fe/Cr Multilayers

AuthID
P-001-4KR

Author(s)

Almeida, BG

Amaral, VS

Sousa, JB

Colino, R

Schuller, IK

Moschalkov, VV

Bruynseraede, Y

Document Type

Article

Year published

1999

Published

in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979

Volume: 85, Issue: 8, Pages: 4433-4435 (3)

Conference

43Rd Annual Conference on Magnetism and Magnetic Materials, Date: NOV 09-12, 1998, Location: MIAMI, FLORIDA, Sponsors: Amer Inst Phys, IEEE Magnet Soc, Minerals Met Mat Soc, Amer Soc Testing & Mat, Amer Ceramic Soc, Amer Phys Soc, EMTEC Magnet GmbH, Fuji Photo Film Co Ltd, IBM, Imation, Sony corp, TDK Corp, Toda Kogyo Corp, ADE Technol Inc, digital Measurement Syst Div, Komag, MMC Technol Inc

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