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Automated Adc Characterization Using the Histogram Test Stimulated by Gaussian Noise
AuthID
P-001-4Q4
2
Author(s)
Martins, RC
·
Serra, AMD
Document Type
Article
Year published
1999
Published
in
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
ISSN: 0018-9456
Volume: 48, Issue: 2, Pages: 471-474 (4)
Conference
1998 Conference on Precision Electromagnetic Measurements (Cpem 98),
Date:
JUL 06-10, 1998,
Location:
WASHINGTON, D.C.,
Sponsors:
Natl Inst Stand & Technol, Bur Int Poids & Mesures, IEEE, Instrumentat & Measurement Soc, Natl Res Council Canada, Union Radio Sci Int, Amer Assoc Lab Accreditat, Andeen Hagerling Inc, APS, Instrument & Measurement Sci Top Grp, APS, Precis Measurement & Fundamental Constants, Baltimore Gas & Elect, Cal Lab Magazine, Clarke Hess Commun Res Corp, Creat Mkt Assoc, Fluke Corp, Guildline Instruments, Hewlett Packard Co, Instrument Support Solut Div, IEEE, Instrument & Measurement Soc, Washington Chapter, IEEE, Natl Capital Area Council, Natl Conf Stand Lab, Org Amer States, Wavetek Corp
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Sources
Publication Identifiers
DOI
:
10.1109/19.769631
SCOPUS
: 2-s2.0-0000818435
Wos
: WOS:000080869600080
Source Identifiers
ISSN
: 0018-9456
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