Dithered Adc Systems in the Presence of Hysteresis Errors

AuthID
P-001-5RW
3
Author(s)
2
Editor(s)
Piuri, V; Savino, M
Document Type
Proceedings Paper
Year published
1999
Published
in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3 in IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, PROCEEDINGS, ISSN: 1091-5281
Volume: 3, Pages: 1648-1652 (5)
Conference
16Th Ieee Instrumentation and Measurement Technology Conference, Date: MAY 24-26, 1999, Location: VENICE, ITALY, Sponsors: IEEE, Instrumentat & Measurement Soc, AEI, ANIPLA, FAST, IMEKO TC-4, Politecn Milano
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Publication Identifiers
SCOPUS: 2-s2.0-0032679598
Wos: WOS:000081629700297
Source Identifiers
ISSN: 1091-5281
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