Non Invasive Microtopographic Inspection of Rough Surfaces by Active Triangulation

AuthID
 P-001-5YV
1
Author(s)
1
Editor(s)
Albertazzi, AJ
Document Type
Proceedings Paper
Year published
2001
Published
in LASER METROLOGY FOR PRECISION MEASUREMENT AND INSPECTION IN INDUSTRY in Proceedings of SPIE, ISSN: 0277-786X
Volume: 4420, Pages: 174-184 (11)
Conference
International Symposium on Laser Metrology for Precision Measurement and Inspection in Industry, Date: OCT 13-15, 1999, Location: FLORIANOPOLIS, BRAZIL, Sponsors: Mercedes Benz Brazil, Siemens, Embraco, Minist Dev, Ind & Trade, INMETRO, Minist Sci & Technol, CNPq, FINEP, Minist Educ
Indexing
Wos®
Scopus®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-0035760189
Wos: WOS:000172924300020
Source Identifiers
ISSN: 0277-786X
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service