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Structural Properties of Ge Nano-Crystals Embedded in Sio2 Films from X-Ray Diffraction and Raman Spectroscopy

AuthID
P-001-6HB

Author(s)

Rolo, AG

Vasilevskiy, MI

Conde, O

Gomes, MJM

Document Type

Article

Year published

1998

Published

in THIN SOLID FILMS, ISSN: 0040-6090

Volume: 336, Issue: 1-2, Pages: 58-62 (5)

Conference

Symposium on Thin Films Epitaxial Growth and Nanostructures, at the E-Mrs Spring Meeting 1998, Date: JUN 16-19, 1998, Location: STRASBOURG, FRANCE, Sponsors: European MRS

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Publication Identifiers

DOI: 10.1016/s0040-6090(98)01298-x

Handle: https://hdl.handle.net/1822/14279

SCOPUS: 2-s2.0-0032320954

Wos: WOS:000078141900014

Source Identifiers

ISSN: 0040-6090

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Structural Properties of Ge Nano-Crystals Embedded in Sio2 Films from X-Ray Diffraction and Raman Spectroscopy

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