A Comparison by Simulation and by Measurement of the Substrate Noise Generated by Cmos, Csl, and Cbl Digital Circuits

AuthID
 P-000-40M
2
Author(s)
Document Type
Article
Year published
2005
Published
in IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, ISSN: 1549-8328
Volume: 52, Issue: 4, Pages: 734-741 (8)
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-18144421551
Wos: WOS:000228228200006
Source Identifiers
ISSN: 1549-8328
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service