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Oxide Scale Depth Profiling of Lanthanum-Deposited Aisi-304: An Ion Beam Analysis
AuthID
P-001-8EE
6
Author(s)
Ager, FJ
·
Respaldiza, MA
·
Paul, A
·
Odriozola, JA
·
da Silva, MF
·
Soares, JC
Document Type
Article
Year published
1998
Published
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
ISSN: 0168-583X
Volume: 136, Pages: 1045-1051 (7)
Conference
13Th International Conference on Ion Beam Analysis (Iba-13),
Date:
JUL 27-AUG 01, 1997,
Location:
LISBON, PORTUGAL
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Publication Identifiers
DOI
:
10.1016/s0168-583x(97)00792-1
SCOPUS
: 2-s2.0-0032021235
Wos
: WOS:000074380400186
Source Identifiers
ISSN
: 0168-583X
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