Oxide Scale Depth Profiling of Lanthanum-Deposited Aisi-304: An Ion Beam Analysis

AuthID
P-001-8EE
6
Author(s)
Ager, FJ
·
Paul, A
·
Odriozola, JA
·
da Silva, MF
·
Document Type
Article
Year published
1998
Published
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X
Volume: 136, Pages: 1045-1051 (7)
Conference
13Th International Conference on Ion Beam Analysis (Iba-13), Date: JUL 27-AUG 01, 1997, Location: LISBON, PORTUGAL
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0032021235
Wos: WOS:000074380400186
Source Identifiers
ISSN: 0168-583X
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