Design, Fabrication, and Wafer Level Testing of (Nife/Cu)(Xn) Dual Stripe Gmr Sensors

AuthID
P-001-ARK
6
Author(s)
Reissner, M
·
Kung, H
Document Type
Article
Year published
1997
Published
in IEEE TRANSACTIONS ON MAGNETICS, ISSN: 0018-9464
Volume: 33, Issue: 5, Pages: 2905-2907 (3)
Conference
35Th Annual Ieee International Magnetics Conference (Intermag 97), Date: APR 01-04, 1997, Location: NEW ORLEANS, LA, Sponsors: IEEE
Indexing
Publication Identifiers
Scopus: 2-s2.0-0031224536
Wos: WOS:A1997XW56400094
Source Identifiers
ISSN: 0018-9464
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.