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Design, Fabrication, and Wafer Level Testing of (Nife/Cu)(Xn) Dual Stripe Gmr Sensors
AuthID
P-001-ARK
6
Author(s)
Freitas, PP
·
Caldeira, MC
·
Reissner, M
·
Almeida, BG
·
Sousa, JB
·
Kung, H
Document Type
Article
Year published
1997
Published
in
IEEE TRANSACTIONS ON MAGNETICS,
ISSN: 0018-9464
Volume: 33, Issue: 5, Pages: 2905-2907 (3)
Conference
35Th Annual Ieee International Magnetics Conference (Intermag 97),
Date:
APR 01-04, 1997,
Location:
NEW ORLEANS, LA,
Sponsors:
IEEE
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Metadata
Sources
Publication Identifiers
DOI
:
10.1109/20.617793
SCOPUS
: 2-s2.0-0031224536
Wos
: WOS:A1997XW56400094
Source Identifiers
ISSN
: 0018-9464
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