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Study of the Sensitivity in an Automatic Capacitance Measurement System
AuthID
P-001-CH3
2
Author(s)
daSilva, MF
·
Serra, AC
1
Editor(s)
Anon
Document Type
Proceedings Paper
Year published
1997
Published
in
IMTC/97 - IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE: SENSING, PROCESSING, NETWORKING, PROCEEDINGS VOLS 1 AND 2
in
IEEE Instrumentation and Measurement Technology Conference,
ISSN: 1091-5281
Volume: 1, Pages: 329-334 (6)
Conference
Ieee Instrumentation and Measurement Technology Conference - Sensing, Processing, Networking (Imtc/97),
Date:
MAY 18-22, 1997,
Location:
OTTAWA, CANADA,
Sponsors:
IEEE Instrumentat & Measurement Soc, IEEE Ottawa Sect
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SCOPUS
: 2-s2.0-0030647778
Wos
: WOS:A1997BH95G00063
Source Identifiers
ISSN
: 1091-5281
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