Evaluation of I(Dd)/V-Out Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits

AuthID
P-001-F4V
2
Author(s)
Document Type
Proceedings Paper
Year published
1996
Published
in EUROPEAN DESIGN & TEST CONFERENCE 1996 - ED&TC 96, PROCEEDINGS in EUROPEAN CONFERENCE ON DESIGN AUTOMATION, ISSN: 1066-1409
Pages: 264-268 (5)
Conference
European Design and Test Conference, Date: MAR 11-14, 1996, Location: PARIS, FRANCE, Sponsors: IEEE, Comp Soc, European Design & Automat Assoc, TTTC, European Grp, DATC, European Grp, ACM SIGDA, European Commiss, ADFTT NIS, AEIA, Spain, AFCET, France, ATI, Spain, BULL, France, CLRC, UK, CNR, Italy, CSIC, Spain, Estonian Electr Soc, GI, Germany, HTE, Hungary, IEEE, Circuits & Syst Soc, IFIP, 10.2/10.5, ITG, Germany, KVIV, Belgium, MATE, Hungary, Polish Acad Sci, VDE, Germany
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0029734409
Wos: WOS:A1996BF10G00043
Source Identifiers
ISSN: 1066-1409
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.