The Histogram Test of Adcs Is Unbiased by Phase Noise

AuthID
 P-00F-HPC
2
Author(s)
Document Type
Proceedings Paper
Year published
2006
Published
in Conference Record - IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Pages: 1639-1642
Conference
Imtc'06 - Ieee Instrumentation and Measurement Technology Conference, Date: 24 April 2006 through 27 April 2006, Location: Sorrento, Sponsors: IEEE Instrumentation and Measurement Society
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Publication Identifiers
SCOPUS: 2-s2.0-36048945990
Source Identifiers
ISSN: 1091-5281
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