Rutherford Backscattering Spectrometry Characterization of Nanoporous Chalcogenide Thin Films Grown at Oblique Angles

AuthID
 P-00F-KEE
5
Author(s)
Martin Palma, RJ
·
Gago, R
·
Ryan, JV
·
Pantano, CG
Document Type
Article
Year published
2008
Published
in JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, ISSN: 0267-9477
Volume: 23, Issue: 7, Pages: 981-984 (4)
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Publication Identifiers
Wos: WOS:000257146000008
Source Identifiers
ISSN: 0267-9477
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