Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
High-Resolution Auger Depth Profiling Of Multilayer Structures Mo/Si, Mo/B4C, Ni/C
AuthID
P-00F-NCH
5
Author(s)
ANDREEV, SS
·
AKHSAKHALYAN, AD
·
DROZDOV, MN
·
POLUSHKIN, NI
·
SALASHCHENKO, NN
Document Type
Article
Year published
1995
Published
in
THIN SOLID FILMS,
ISSN: 0040-6090
Volume: 263, Issue: 2, Pages: 169-174 (6)
Indexing
Wos
®
Scopus
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1016/0040-6090(95)06537-7
Scopus
: 2-s2.0-0029346345
Wos
: WOS:A1995RM78300007
Source Identifiers
ISSN
: 0040-6090
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service