Microscopic Characterization of Microcrystalline Silicon Thin Films

AuthID
 P-00F-NH1
6
Author(s)
Sieber, I
·
Urban, I
·
Dorfel, I
·
Koynov, S
·
Schmidt, M
Document Type
Article
Year published
1996
Published
in Thin Solid Films, ISSN: 0040-6090
Volume: 276, Issue: 1-2, Pages: 314-317
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0030122954
Source Identifiers
ISSN: 0040-6090
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