Sims Characterization of Noble Metal-Based Thin Film Electrodes

AuthID
 P-00F-NMZ
6
Author(s)
Daolio, S
·
Gelosi, S
·
Pagura, C
·
Facchin, B
·
Kristof, J
Document Type
Article
Year published
1997
Published
in Materials Science Forum, ISSN: 0255-5476
Volume: 235-238, Issue: PART 2, Pages: 625-630
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0030836202
Source Identifiers
ISSN: 0255-5476
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