Exafs Characterization of Nickel Clusters in Ni/Si3N4 Sputtered Thin Films

AuthID
 P-00F-RRE
4
Author(s)
Jimenez Villacorta, F
·
Prieto, C
·
Traverse, A
Document Type
Article
Year published
2005
Published
in Physica Scripta T, ISSN: 0281-1847
Volume: T115, Pages: 454-456
Conference
12Th X-Ray Absorption Fine Structure International Conference, Xafs12, Date: 23 June 2003 through 27 June 2003, Location: Malmo, Sponsors: Royal Swedish Academy of Sciences, Nobel Institute for Physics;Swedish Foundation for Strategic Research;Crafoord Foundation;University of Lund;Swedish Research Council
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Publication Identifiers
SCOPUS: 2-s2.0-29144431864
Source Identifiers
ISSN: 0281-1847
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