Simultaneous Depth Profiling of Constituents and Impurities by Elastic Proton Scattering in Amorphous Hydrogenated Silicon Films

AuthID
 P-00F-TNQ
4
Author(s)
Kolodzey, JS
·
Wagner, S
·
Kouzes, RT
Document Type
Article
Year published
1987
Published
in Applied Physics Letters, ISSN: 0003-6951
Volume: 50, Issue: 4, Pages: 188-190
Indexing
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-36549091523
Source Identifiers
ISSN: 0003-6951
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service