Seeing Inside Materials by Aberration-Corrected Electron Microscopy

AuthID
P-00F-X8T
8
Author(s)
Pennycook, SJ
·
Van Benthem, K
·
Oh, SH
·
Molina, SI
·
Borisevich, AY
·
Luo, W
·
Pantelides, ST
Document Type
Article
Year published
2011
Published
in International Journal of Nanotechnology, ISSN: 1475-7435
Volume: 8, Issue: 10-12, Pages: 935-947
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Publication Identifiers
SCOPUS: 2-s2.0-84857201880
Source Identifiers
ISSN: 1475-7435
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