Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Seeing Inside Materials by Aberration-Corrected Electron Microscopy
AuthID
P-00F-X8T
8
Author(s)
Pennycook, SJ
·
Van Benthem, K
·
Marinopoulos, AG
·
Oh, SH
·
Molina, SI
·
Borisevich, AY
·
Luo, W
·
Pantelides, ST
Document Type
Article
Year published
2011
Published
in
International Journal of Nanotechnology,
ISSN: 1475-7435
Volume: 8, Issue: 10-12, Pages: 935-947
Indexing
Scopus
®
Crossref
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1504/ijnt.2011.044438
SCOPUS
: 2-s2.0-84857201880
Source Identifiers
ISSN
: 1475-7435
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service