Experimental Determination of Residual Stress in Silicon Nitride Diffusion Bonds Obtained by High-Energy X-Ray Diffraction

AuthID
 P-00F-Y74
7
Author(s)
Martinez, ML
·
Prieto, C
·
Miranzo, P
·
Osendi, MI
·
Terry, A
·
Vaughan, G
Document Type
Proceedings Paper
Year published
2004
Published
in Powder Technology, ISSN: 0032-5910
Volume: 148, Issue: 1, Pages: 60-63
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Publication Identifiers
SCOPUS: 2-s2.0-9944255174
Source Identifiers
ISSN: 0032-5910
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