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Normal Incidence Imaging Multilayer X-Ray Mirrors With The Periods Of Nanometer And Subnanometer Scale

AuthID
P-00G-90W

Author(s)

SALASHCHENKO, NN

GAPONOV, SV

AKHSAKHALYAN, AD

ANDREEV, SS

PLATONOV, YY

POLUSHKIN, NI

SHAMOV, EA

SHINKAREV, SI

ZUEV, SA

Editor(s)

Hoover, RB; Walker, ABC

Document Type

Proceedings Paper

Year published

1994

Published

in MULTILAYER AND GRAZING INCIDENCE X-RAY/EUV OPTICS II in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)

Volume: 2011, Pages: 402-412 (11)

Conference

Conference on Multilayer and Grazing Incidence X-Ray/Euv Optics Ii, Date: JUL 14-16, 1993, Location: SAN DIEGO, CA, Sponsors: SOC PHOTO OPT INSTRUMENTAT ENGINEERS

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Publication Identifiers

DOI: 10.1117/12.167234

Wos: WOS:A1994BZ74W00038

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Normal Incidence Imaging Multilayer X-Ray Mirrors With The Periods Of Nanometer And Subnanometer Scale

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