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Sub-Surface Defect Detection with Motion Induced Eddy Currents in Aluminium

AuthID
P-00G-FBF

Author(s)

Rocha, T

Ramos, H

Ribeiro, AL

Pasadas, D

Document Type

Proceedings Paper

Year published

2015

Published

in 2015 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC), ISSN: 1091-5281

Volume: 2015-July, Pages: 930-934 (5)

Conference

32Nd Annual Ieee International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 11-14, 2015, Location: Pisa, ITALY, Sponsors: IEEE

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Publication Identifiers

DOI: 10.1109/i2mtc.2015.7151394

Scopus: 2-s2.0-84938890783

Wos: WOS:000380587900158

Source Identifiers

ISSN: 1091-5281

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Sub-Surface Defect Detection with Motion Induced Eddy Currents in Aluminium

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