Microtopographic Inspection Of Surfaces - A Comparison Between Moire, Contrived Lightning And Discreet Triangulation Methods

AuthID
 P-001-NMH
2
Author(s)
ALMEIDA, JB
3
Editor(s)
Kwon, OY; Brown, GM; Kujawinska, M
Document Type
Proceedings Paper
Year published
1993
Published
in INTERFEROMETRY VI: TECHNIQUES AND ANALYSIS in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
Volume: 2003, Pages: 30-37 (8)
Conference
Conference on Interferometry Vi: Techniques and Analysis, Date: JUL 12-13, 1993, Location: SAN DIEGO, CA, Sponsors: SOC PHOTO OPT INSTRUMENTAT ENGINEERS, SOC EXPTL MECH
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Publication Identifiers
Wos: WOS:A1993BZ81H00004
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