in INTERNATIONAL TEST CONFERENCE 1993 PROCEEDINGS: DESIGNING, TESTING, AND DIAGNOSTICS - JOIN THEM
Pages: 323-331 (9)
Conference
International Test Conference 1993: Designing, Testing, and Diagnostics - Join Them, Date: OCT 17-21, 1993, Location: BALTIMORE, MD, Sponsors: IEEE, COMP SOC, TEST TECHNOL TECH COMM, IEEE, PHILADELPHIA SECT
