Microscopic Characterization Of Materials By Ion-Beam And Hyperfine Interaction Analysis

AuthID
 P-001-PWT
1
Author(s)
Document Type
Article
Year published
1992
Published
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X
Volume: 64, Issue: 1-4, Pages: 215-220 (6)
Conference
10Th International Conf On Ion Beam Analysis, Date: JUL 01-05, 1991, Location: EINDHOVEN, NETHERLANDS, Sponsors: EINDHOVEN UNIV TECHNOL, CANBERRA IND, APTEC EUROPE, BALZERS PERKIN ELMER PHYS ELECTR, CHARLES EVANS & ASSOC, DUTCH VACUUM SOC, ELSEVIER SCI PUBL, FISONS INSTRUMENTS, FDN FUNDAMENTAL RES MATTER, FDN PHYSICA, Host: EINDHOVEN UNIV TECHNOL
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Publication Identifiers
SCOPUS: 2-s2.0-0005182179
Wos: WOS:A1992HK52600038
Source Identifiers
ISSN: 0168-583X
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