Electron Paramagnetic Resonance of Defects in Doped Microcrystalline Silicon

AuthID
 P-00H-65T
7
Author(s)
Lavado, M
·
Guimarães, L
Document Type
Article
Year published
1989
Published
in Vacuum, ISSN: 0042-207X
Volume: 39, Issue: 7-8, Pages: 791-794
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ISSN: 0042-207X
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