Electron Paramagnetic Resonance of Defects in Doped Microcrystalline Silicon

AuthID
 P-00H-65T
7
Author(s)
Lavado, M
·
Guimarães, L
Document Type
Article
Year published
1989
Published
in Vacuum, ISSN: 0042-207X
Volume: 39, Issue: 7-8, Pages: 791-794
Indexing
Crossref®
Google Scholar®
Publication Identifiers
Source Identifiers
ISSN: 0042-207X
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service