Spectroscopic Ellipsometry Study of Amorphous Silicon Anodically Oxidised

AuthID
 P-00H-FB2
6
Author(s)
Gonçalves, A
·
Document Type
Article
Year published
2003
Published
in Thin Solid Films, ISSN: 0040-6090
Volume: 427, Issue: 1-2, Pages: 345-349
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ISSN: 0040-6090
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