Measurement of the Dopant Concentration in a Semiconductor Using the Seebeck Effect

AuthID
 P-00H-PMA
6
Author(s)
Pó, JM
·
Vallêra, AM
Document Type
Article
Year published
2013
Published
in Measurement Science and Technology - Meas. Sci. Technol., ISSN: 0957-0233
Volume: 24, Issue: 5, Pages: 055601
Indexing
Crossref®
Google Scholar®
Publication Identifiers
Source Identifiers
ISSN: 0957-0233
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service