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Experimental Analysis of Outage Times for Profibus Networks
AuthID
P-000-5W8
3
Author(s)
Carvalho, JA
·
Carvalho, AS
·
Portugal, PJ
4
Editor(s)
Franquelo,LG;Malinowski,A;Chow,MY;Hess,HL
Document Type
Proceedings Paper
Year published
2005
Published
in
IECON 2005: THIRTY-FIRST ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, VOLS 1-3
in
IEEE Industrial Electronics Society,
ISSN: 1553-572X
Volume: 2005, Pages: 421-426 (6)
Conference
31St Annual Conference of the Ieee-Industrial-Electronics-Society,
Date:
NOV 06-10, 2005-2006,
Location:
Raleigh, NC,
Sponsors:
IEEE Ind Elect Soc, NORTEL, Schneider Elect, SICE, NC State Univ, IEEE, Adv Energy, Celisca, NUCOR, EATON
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Publication Identifiers
DOI
:
10.1109/iecon.2005.1568942
Handle
:
https://hdl.handle.net/10198/1887
SCOPUS
: 2-s2.0-33749662161
Wos
: WOS:000236873600074
Source Identifiers
ISSN
: 1553-572X
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