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Field Emission Interferometry with the Scanning Tunneling Microscope
AuthID
P-00J-H6G
8
Author(s)
Caamaño, A
·
Pogorelov, Y
·
Custance, O
·
Méndez, J
·
Baró, A
·
Veuillen, J
·
Gómez-Rodrı́guez, J
·
Sáenz, J
Document Type
Article
Year published
1999
Published
in
Surface Science,
ISSN: 0039-6028
Volume: 426, Issue: 1, Pages: L420-L425
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DOI
:
10.1016/s0039-6028(99)00346-5
Source Identifiers
ISSN
: 0039-6028
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