Substrate Noise Isolation Improvement in a Single-Well Standard Cmos Process

AuthID
 P-00J-Z5Q
3
Author(s)
Document Type
Article
Year published
2016
Published
in INTEGRATION-THE VLSI JOURNAL, ISSN: 0167-9260
Volume: 52, Pages: 122-128 (7)
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Publication Identifiers
Scopus: 2-s2.0-84949786098
Wos: WOS:000367127500012
Source Identifiers
ISSN: 0167-9260
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