Yield Prediction With a New Generalized Process Capability Index Applicable to Non-Normal Data

AuthID
 P-00K-ES8
3
Author(s)
Weber, S
·
Document Type
Article
Year published
2016
Published
in IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, ISSN: 0278-0070
Volume: 35, Issue: 6, Pages: 931-942 (12)
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Publication Identifiers
SCOPUS: 2-s2.0-84971353905
Wos: WOS:000377105700005
Source Identifiers
ISSN: 0278-0070
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