Composition Measurement of Epitaxial Scxga1-Xn Films

AuthID
P-00K-HD9
11
Author(s)
Tsui, HCL
·
Goff, LE
·
Davies, RJ
·
Farrer, I
·
Ritchie, DA
·
Moram, MA
Document Type
Article
Year published
2016
Published
in SEMICONDUCTOR SCIENCE AND TECHNOLOGY, ISSN: 0268-1242
Volume: 31, Issue: 6, Pages: 064002 (6)
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Publication Identifiers
Scopus: 2-s2.0-84973369301
Wos: WOS:000378201000005
Source Identifiers
ISSN: 0268-1242
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