Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Composition Measurement of Epitaxial Scxga1-Xn Films
AuthID
P-00K-HD9
11
Author(s)
Tsui, HCL
·
Goff, LE
·
Barradas, NP
·
Alves, E
·
Pereira, S
·
Palgrave, RG
·
Davies, RJ
·
Beere, HE
·
Farrer, I
·
Ritchie, DA
·
Moram, MA
Document Type
Article
Year published
2016
Published
in
SEMICONDUCTOR SCIENCE AND TECHNOLOGY,
ISSN: 0268-1242
Volume: 31, Issue: 6, Pages: 064002 (6)
Indexing
Wos
®
Scopus
®
Crossref
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1088/0268-1242/31/6/064002
SCOPUS
: 2-s2.0-84973369301
Wos
: WOS:000378201000005
Source Identifiers
ISSN
: 0268-1242
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service