3D Modeling of Electrostatic Interaction Between Atomic Force Microscopy Probe and Dielectric Surface: Impact of Tip Shape and Cantilever Contribution

AuthID
P-00K-J91
5
Author(s)
Boularas, A
·
Baudoin, F
·
Teyssedre, G
·
Villeneuve Faure, C
·
Document Type
Article
Year published
2016
Published
in IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, ISSN: 1070-9878
Volume: 23, Issue: 2, Pages: 705-712 (8)
Conference
9Th Conference of the French-Society-Of-Electrostatics, Date: AUG 27-29, 2014, Location: Toulouse, FRANCE, Sponsors: French Soc Electrostat, Paul Sabatier Univ, Lab Plasma & Energy Convers, French Natl Ctr Sci Res
Indexing
Publication Identifiers
Scopus: 2-s2.0-84973484186
Wos: WOS:000377461500013
Source Identifiers
ISSN: 1070-9878
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.