Publications

3D Modeling of Electrostatic Interaction Between Atomic Force Microscopy Probe and Dielectric Surface: Impact of Tip Shape and Cantilever Contribution

AuthID
P-00K-J91

Author(s)

Boularas, A

Baudoin, F

Teyssedre, G

Villeneuve Faure, C

Clain, S

Document Type

Article

Year published

2016

Published

in IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, ISSN: 1070-9878

Volume: 23, Issue: 2, Pages: 705-712 (8)

Conference

9Th Conference of the French-Society-Of-Electrostatics, Date: AUG 27-29, 2014, Location: Toulouse, FRANCE, Sponsors: French Soc Electrostat, Paul Sabatier Univ, Lab Plasma & Energy Convers, French Natl Ctr Sci Res

Indexing

Wos^®

Scopus^®

Crossref^®

Google Scholar^®

Metadata
Sources

Publication Identifiers

DOI: 10.1109/tdei.2016.005341

Scopus: 2-s2.0-84973484186

Wos: WOS:000377461500013

Source Identifiers

ISSN: 1070-9878

Export Publication Metadata

Marked List

Add to Marked List

Info

At this moment we don't have any links to full text documens.

3D Modeling of Electrostatic Interaction Between Atomic Force Microscopy Probe and Dielectric Surface: Impact of Tip Shape and Cantilever Contribution

Useful Links

Get Help

Federated Authentication (Click on the image)

3D Modeling of Electrostatic Interaction Between Atomic Force Microscopy Probe and Dielectric Surface: Impact of Tip Shape and Cantilever Contribution

Useful Links

Get Help