Yield Optimization Using K-Means Clustering Algorithm to Reduce Monte Carlo Simulations

AuthID
P-00K-T8T
Document Type
Proceedings Paper
Year published
2016
Published
in 2016 13TH INTERNATIONAL CONFERENCE ON SYNTHESIS, MODELING, ANALYSIS AND SIMULATION METHODS AND APPLICATIONS TO CIRCUIT DESIGN (SMACD)
Conference
13Th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (Smacd), Date: JUN 27-30, 2016, Location: Lisbon, PORTUGAL
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Publication Identifiers
SCOPUS: 2-s2.0-84983739196
Wos: WOS:000392267900025
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