All-Inkjet-Printed Thin-Film Transistors: Manufacturing Process Reliability by Root Cause Analysis

AuthID
P-00K-X88
11
Author(s)
Ramon, E
·
Martinez Domingo, C
·
Pedro, M
·
Pallares, J
·
Loffredo, F
·
Villani, F
·
Teres, L
·
Baumann, RR
Document Type
Article
Year published
2016
Published
in SCIENTIFIC REPORTS, ISSN: 2045-2322
Volume: 6, Pages: 33490 (15)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84988867518
Wos: WOS:000383562800001
Source Identifiers
ISSN: 2045-2322
Export Publication Metadata
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